Aim-TTi TGP3151 Pulse Generator, 1 MHz min, 50 MHz max

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RS庫存編號:
112-0943
製造零件編號:
TGP3151
製造商:
Aim-TTi
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Aim-TTi

Maximum Frequency

50MHz

Product Type

Pulse Generator

Minimum Frequency

1MHz

Maximum Pulse Width

499.99999999s (Double Pulse), 999.99999999s (Pulse)

Modes

Double Pulse, Function, Modulation, Noise, Pattern, Policy Based Routes, Pulse, Square, Sweep, Triggered, Arbitrary, Burst

Minimum Pulse Width

10ns

Maximum Pulse Delay

999.99999998s (Pulse), 999.99999996s (Double Pulse)

Minimum Pulse Delay

0ns

Adjustable Output Amplitude

Yes

Jitter

30%

Rise - Fall Time

799.99s

Minimum Operating Temperature

5°C

Input Impedance

10kΩ

Maximum Operating Temperature

40°C

Standards/Approvals

No

Interface Type

USB, USB 2.0, LXI, Remote, GPIB, LAN

Weight

3.2kg

Length

295mm

Height

97mm

Width

250 mm

COO (Country of Origin):
GB

Aim-TTi Pulse Generator, 10 kO Input Impedance, 1 Channel - 59120-5340


This pulse generator by Aim-TTi is a versatile and advanced piece of equipment designed for applications in areas such as automation, electronics, electrical, and mechanical industries. With adjustable output amplitude and high frequencies, it offers precise and reliable performance for various applications.

Features & Benefits


• Adjustable output amplitude for precise control

• High frequency capability for applications requiring fast pulses

• Pulse width modulation for flexible waveform generation

• Triggered burst mode for specific pulse sequencing

• Compact design for both benchtop and rack mount applications

Applications


• Used for stress testing designs requiring defined jitter and delay

• Ideal for clock frequency simulation with glitch-free parameter changes

• Suitable for creating data sequencing patterns for serial data testing

• Efficient for asynchronous pulse signal conditioning

• Helps in Op Amp slew rate and asymmetrical characterisation

Can it be used for clock frequency simulation applications?


Yes, it is ideal for simulating clock frequencies with glitch-free changes in pulse parameters.

Will it assist in stress testing designs?


Yes, it is designed for stress testing designs with defined jitter and delay requirements.

Is it suitable for data sequencing patterns?


Yes, it can efficiently generate data sequencing patterns for serial data testing applications.

Can it be used for signal conditioning?


Yes, it is suitable for asynchronous pulse signal conditioning purposes.

Is it helpful in Op Amp slew rate measurements?


Yes, it facilitates Op Amp slew rate and asymmetrical characterisation tasks.

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